Home

   Products

   Contact Us

 

DataLyzer® Gage Management

DataLyzer Spectrum

Quickie 98

SPC Wizard

Local Area Network

 

 

View Guided Tour

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

DataLyzer® Spectrum Gage Management

SPC analysis is largely affected by measurement system error. Gaging instruments, inspection techniques and fixturing all make up a measuring system. Any of these components can introduce variation in the measuring system. This variation in the measuring system is then reflected as part of total process variation in the SPC analysis and negatively affects key quality statistics like Cpk, Ppk, Ppm etc. DataLyzer® Spectrum Gage Management helps to quantify this measurement system variation and provides tools for reducing it.

 

Contents Gage Management

DataLyzer® Spectrum Gage Management will operate alone or it will link to the DataLyzer® Spectrum SPC module. When linked, the Gage Management module shares the Spectrum database offering access to common setup information like characteristic specifications along with statistical results like Ppk/Cpk and "Gage R&R % of tolerance" so improvements to gaging systems can be evaluated and the improvement in overall process performance can be measured.

The 3 components of the Gage Management system are:

  • Gage Calibration
    Records whether results from a given measuring system are true to a standard and determines whether existing bias is within an acceptable range. The Gage Management software further maintains a history of these calibration analyses for each measurement system.

  • Gage and Supplier information
    Gage location, Gage supplier, supplier information like shipping address, costs, service-records etc.. These records are maintained to allow quick reference for instrument service or replacement.  

  • Gage Repeatability and Reproducibility studies
    The system allows fast and convenient study creation with a format, which makes the studies easy to perform. Study results can be reviewed singly and historically. The system further allows comparison of alternative gage systems for the given process to minimize overall process variation or evaluate cost vs. performance trade-offs.

Gage Calibration

  • Internal and external calibration are supported

  • Calibration Study history, due dates and scheduling for calibration studies, is supported

  • Calibration procedure can be user defined and applied to all desired gages.

Calibration is often the largest ongoing cost of a quality assurance department, so an effective system will help you to reduce these costs. 

 

Gage Repeatability & Reproducibility

Even if a measurement system can measure accurately without bias, how consistently can it measure production parts?

  • When used by one individual at different times

  • When used by more than one individual over time

The system allows for standard Gage R&R studies and ANOVA studies

 

Gage and Supplier Information

  • Gage information includes location, status, required supplies, gage type, supplier information, calibration and GRR intervals etc.

  • Supplier information like address, contacts, order information etc.

 

Features

 

Gage R&R features list

Study history, due dates and scheduling for Gage R & R studies is supported by reports and other means designating which gages need to be re-studied during any given week or month. 

 

Data Entry Methods

  • Manual from keyboard

  • Automatically from gage via RS-232 and USB

  • Import from spreadsheet

Data Output

Preformatted reports are included.

 

Data Input & Analysis
Input methods include: by trial, randomized or open form/any order.

Average and Range

  • Long Variable studies (2-3 operators, 2-3 trials, 8-10 parts)

  • Short variable studies (2-3 operators, 2-3 trials, 5 parts)

  • Performance curve

  • Long Attribute (8-10 samples)

  • Short Attribute

ANOVA

 

File Compatibility
Versions available for MS® Access, SQL Server® or Oracle®. Use stand-alone or link with SPC DataLyzer® Spectrum to share common information.

 



 

 

 

 

 

 

 

 

 

 


 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 


 

 

 

 

 


Copyright©, 2004 Reliable Measuring Systems,